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DeCS
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Descriptor English:
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Spectrometry, Mass, Secondary Ion
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Descriptor Spanish:
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Espectrometría de Masa de Ion Secundario
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Descriptor Portuguese:
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Espectrometria de Massa de Íon Secundário
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Synonyms English:
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Mass Spectrometry, Secondary Ion
Mass Spectroscopy, Secondary Ion
SIMS Microscopy
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry Microscopy
Secondary Ion Mass Spectroscopy
Secondary Ion Mass Spectroscopy Microscopy
Spectroscopy, Mass, Secondary Ion
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Tree Number:
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E05.196.566.760
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Definition English:
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A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions. |
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Indexing Annotation English:
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for SIMS microscopy, coordinate with type of microscopy
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History Note English:
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95
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Allowable Qualifiers English:
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Record Number:
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32021
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Unique Identifier:
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D018629
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Occurrence in VHL:
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Similar:
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DeCS
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